Landon Featured as AIF User Spotlight

Landon was featured in the Student User Spotlight at NCSU’s Analytical Instrumentation Facility (AIF) for December 2021 highlighting his experience with AIF! He frequently uses SPECS, ION-TOF SIMS 5, SEM, and AFM to characterize his samples made from thin film deposition techniques of atomic layer deposition (ALD) and atomic layer etching (ALE). The AIF website features an article about Landon and his experience with AIF. Check out the whole spotlight here!