Jung-Sik Kim was featured in the Student User Spotlight at NCSU’s Analytical Instrumentation Facility (AIF) this January. He frequently uses the Verios SEM, TEM, FIB, XRR, and XPS to characterize thin film nucleation in his ALD/MLD research. The AIF website features a nice article about Jung-Sik and his work on MLD of polyurea. Read the whole article here. Keep up the good work Justin!
